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  RTL Synthesis(Design Synthesis)培训
   班级规模及环境
       为了保证培训效果,增加互动环节,我们坚持小班授课,每期报名人数限3到5人,多余人员安排到下一期进行。
   上课时间和地点
上课地点:【上海】:同济大学(沪西)/新城金郡商务楼(11号线白银路站) 【深圳分部】:电影大厦(地铁一号线大剧院站)/深圳大学成教院 【北京分部】:北京中山学院/福鑫大楼 【南京分部】:金港大厦(和燕路) 【武汉分部】:佳源大厦(高新二路) 【成都分部】:领馆区1号(中和大道) 【沈阳分部】:沈阳理工大学/六宅臻品 【郑州分部】:郑州大学/锦华大厦 【石家庄分部】:河北科技大学/瑞景大厦
最近开课时间(周末班/连续班/晚班)
RTL Synthesis(Design Synthesis)培训:2015年6月8日
   学时
     ◆课时: 共5天,30学时

        ◆外地学员:代理安排食宿(需提前预定)
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        ☆合格学员免费推荐工作

        ☆合格学员免费颁发相关工程师等资格证书,提升您的职业资质

        专注高端培训15年,曙海提供的证书得到本行业的广泛认可,学员的能力
        得到大家的认同,受到用人单位的广泛赞誉。

        ★实验设备请点击这儿查看★
   最新优惠
       ◆团体报名优惠措施:两人95折优惠,三人或三人以上9折优惠 。注意:在读学生凭学生证,即使一个人也优惠500元。
   质量保障

        1、培训过程中,如有部分内容理解不透或消化不好,可免费在以后培训班中重听;
        2、培训结束后,培训老师留给学员手机和Email,免费提供半年的技术支持,充分保证培训后出效果;
        3、培训合格学员可享受免费推荐就业机会。 ☆合格学员免费颁发相关工程师等资格证书,提升您的职业资质。专注高端培训13年,曙海提供的证书得到本行业的广泛认可,学员的能力得到大家的认同,受到用人单位的广泛赞誉。

  RTL Synthesis(Design Synthesis)培训
培训方式以讲课和实验穿插进行

课程描述:

第一阶段 Design Compiler 1

Overview
This course covers the ASIC synthesis flow using Design Compiler Topographical / Graphical -- from reading in an RTL design (Verilog, SystemVerilog and VHDL) to generating a final gate-level netlist. You will learn how to read in your design file(s), specify your libraries and physical data, constrain a complex design for timing and floorplan, apply synthesis techniques using Ultra, compile to achieve timing closure and an acceptable congestion, analyze the synthesis results for timing and congestion, and generate output data that works with downstream layout tools.

You will verify the logic equivalence of synthesis transformations (such as Datapath optimizations and Register Retiming) to that of an RTL design using Formality. The course includes labs to reinforce and practice key topics discussed in lecture. All the covered commands and flows are printed separately in a 5-page Job Aid, which you can refer to back at work.

Objectives
At the end of this workshop the student should be able to:
  • Create a setup file to specify the libraries and physical data
  • Read in a hierarchical design
  • Constrain a complex design for timing, taking into account different environmental attributes such as output loading, input drive strength, process, voltage and temperature variations, as well as post-layout effects such as clock skew
  • Constrain multiple (generated) clocks considering Signal integrity analysis
  • Execute the recommended synthesis techniques to achieve timing closure
  • Analyze and Improve global route congestion
  • Perform test-ready synthesis
  • Verify the logic equivalence of a synthesized netlist compared to an RTL design
  • Write DC-Tcl scripts to constrain designs, and run synthesis
  • Generate and interpret timing, constraint, and other debugging reports
  • Understand the effect that RTL coding style can have on synthesis results
  • Generate output data (netlist, constraints, scan-def) that works with downstream physical design or layout tools

Course Outline

Unit 1
  • Introduction to Synthesis
  • Design and Technology Data
  • Design and Library Objects
  • Timing Constraints

Unit 2
  • Environmental Attributes
  • Synthesis Optimization Techniques
  • Timing Analysis

Unit 3
  • Additional Constraint Options
  • Multiple Clocks and Timing Exceptions
  • Congestion Analysis and Optimization
  • Post-Synthesis Output Data
  • Conclusion



第二阶段 Design Compiler 2: Low Power

Overview
At the end of this one day, seminar based, workshop you will understand how to apply both traditional and UPF based power optimization techniques during RTL synthesis and scan insertion:

For single voltage designs, you will learn how to apply the 2 traditional power optimization techniques of clock gating and leakage power recovery, optimizing for dynamic power and leakage power respectively.

For multi-voltage or multi-supply designs, you will learn how to apply the IEEE 1801 UPF flow that uses a power intent specification which is applied to RTL designs. You will understand how to synthesize RTL designs for the required power intent and power-optimization requirements using top-down vs. hierarchical UPF methodologies. You will also learn how to insert scan chains to the synthesized netlist ensure that the gate level design does not have any multi-voltage violations, before writing out design data for Place and Route.

Objectives

At the end of this workshop the student should be able to:

  • Apply clock gating to a design at the RTL and gate level
  • Perform multi-stage, hierarchical, and power driven clock gating
  • Perform leakage optimization using multi Vt libraries
  • Restrict the usage of leaky cells
  • Specify power intent using UPF
  • Demonstrate flexible isolation strategy in UPF 2.0
  • Check for UPF readiness of library, reporting PG pins
  • State the purpose of SCMR attribute in library
  • Recognize tradeoff when using dual vs. single rail special cells
  • Correctly specify PVT requirements
  • State how the 6 special cells are synthesized
  • Describe supply net aware Always on Synthesis
  • Apply 2 key debugging commands in a UPF flow
  • Control voltage, power domain mixing when inserting scan chains
  • Allow/prevent the reuse of level shifters and isolation cells between scan and functional paths
  • Minimize toggle in functional logic during scan shifting
  • Validate SCANDEF information for place and route

Course Outline

  • Clock Gating
  • Leakage Power Optimization
  • Power Intent using IEEE 1801 UPF
  • Library Requirements
  • Synthesis with UPF
  • Power Aware DFT



第三阶段 DFT Compiler

Overview
In this workshop you will learn to use DFT Compiler to perform RTL and gate-level DFT rule checks, fix DFT DRC rule violations, and to insert scan using top-down and bottom-up flows. The workshop explores essential techniques to support large, multi-million gate SOC designs including the bottom-up scan insertion flow in the logical (Design Compiler) domain. Techniques learned include: performing scan insertion in a top-down flow; meeting scan requirements for number of scan chains, maximum chain length and reusing functional pins for scan testing, inserting an On-Chip Clocking (OCC) controller for At-Speed testing using internal clocks; and using Adaptive Scan (DFTMAX) to insert additional DFT hardware to reduce the test time and the test data volume required for a given fault coverage.

Objectives
At the end of this workshop the student should be able to:
  • Create a test protocol for a design and customize the initialization sequence, if needed, to prepare for DFT DRC checks
  • Perform DFT DRC checks at the RTL, pre-DFT, and post-DFT stages
  • Recognize common design constructs that cause typical DFT violations
  • Automatically correct certain DFT violations at the gate level using AutoFix
  • Implement top-down scan insertion flow achieving well-balanced scan chains
  • Write a script to perform all the steps in the DFT flow, including exporting all the required files for ATPG and Place & Route
  • Develop a bottom-up scan insertion script for full gate-level designs to use Test Models at the top-level to improve capacity and runtime
  • Insert an On-Chip Clocking (OCC) controller to use for At-Speed testing with internal clocks
  • Modify a scan insertion script to include DFT-MAX Adaptive Scan compression

Course Outline

Unit 1
  • Introduction to Scan Testing
  • DFT Compiler Flows and Setup
  • Test Protocol
  • DFT Design Rule Checks

Unit 2
  • DFT DRC GUI Debug
  • DRC Fixing
  • Top-Down Scan Insertion
  • Exporting Files

Unit 3
  • High Capacity DFT Flows
  • On-Chip Clocking (OCC)
  • Multi-Mode DFT
  • DFT MAX

 
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